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Product ID: PCB REPAIR

ATE IN CIRCUIT E FUNZIONALI

Qmax, Tester Innovativi
Qmax con le sue metodologie innovative nelle applicazioni di test ha anticipato imponendo uno standard.
Propone soluzioni totali di test basate sulle reali necessità dell'Industria. Qmax si è guadagnata una posizione sul mercato ed è attivamente coinvolta nello sviluppo di sistemi per il test di semiconduttori e tester funzionali per schede elettroniche.



ATE IN CIRCUIT E FUNZIONALI()
ATE IN CIRCUIT E FUNZIONALI
Specifications:
  • PCB REPAIR & RECOVERY SYSTEM
    • IN-CIRCUIT FUNCIOTNAL TESTER
  • FUNCTIONAL TESTERS
  • SIGNATURE ANALYSERS
  • SHORT LOCATORS
    • PCB REPAIR E DIAGNOSTIC TESTER
      • V200 is a cost effective mini ATE system, designed to cater the needs of PCB Test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FBGA VLSI chips.
    • SEMICON TESTERS
      • as an Ultra Fast Open / Short / Diode Drop tester for semi-con industry, where production testing of high pin count devices are involved and test time is critical
  • High speed testing at 2 seconds for 2 million test combinations
  • Can be interfaced to any type of test fixtures
  • Multi-Site Test support for Strip or Multiple device test.
  • 16 Opto Isolated digital outputs for handler interface, binning and PASS / FAIL indicators.
  • 16 Opto Isolated Digital Inputs for Operator console and handler interface.
  • Opto Isolated Digital I/Os are fully programmable for timing compliance of various handlers.
  • Fast turnaround time to test new products
    • ATE AUTOMATED TEST SISTEM
      • Micro ATE QT-2216
  • The semiconductor industry has never been so competitive before. There is this need to reduce cost so as to remain competitive or face being knocked out of the market. The semiconductor test industry has always been very capital intensive and this is due primarily to the very costly test equipment that were used to do final test.
    • TROUBLESHOOTER
      • QT1100 - In-Circuit Digital Functional Testing
  • Auto compensation with Qmax Simulator
  • Board Learn & Board Test Modes
  • QSM VI – an advanced tool for failure analysis
  • Auto Guarding
  • Logic Analyser
  • Circuit Tracing
  • Developing New Device Program
  • Short Locator
  • RCV Measurement & Oscilloscope


  • Main Product:
    Programmatori di memorie. Sistemi ispezione Ottica   Test Boundary Scan  

    Ordering information:
    • Minimum Order: Negotiable

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