EDX660 XRF
Product ID: EDX660 XRF
Specification:
Content ration Range :0.1%---99.99%
Measurement time :60---300 seconds
ACCURACY :0.1%
Test the coating thickness precision:0.01~0.05 m
Metals Range :Au Ag Cu Zn Ni
Pd Pt Rh Cd Ru
Weight :23KG
Dimension :350*550*400mm
X-Ray :X-ray tube
Detect source : proportional counter
Configuration:
Side cover type sample chamber
amplifier
high voltage power supply
X-ray tube
propertional counter
IBM computer
.EDX660 XRF
Main Products:
EDX, ICP, WDX series, XRF Spectrometer