Semi-conductor test probe SCP035(63)-BU-86-G
Pitch 0.45mm
Mechanical Specification
Full Stroke: 1.3mm
Rated Stroke: 0.80mm
Spring Force: 20gf@load 0.80mm
Electrical Specification Current Rating: 0.3A, Continuous
Bandwidth: 2GHz@-1dB
Propagation Delay: 42 ps
Materials
Barrel: Phosphor Bronze, Gold Plated.
Plunger: Full-Hard beryllium Copper. Gold Plated
Spring: Music Wire, Gold Plated.
Semi-conductor test probe SCP035(63)-BU-86-G is can be applied to mobile phones, computers, etc. In addition to this model, we also manufacture a variety of test probes of small diameters. With over 30 years’ manufacturing experience, our factory is able to supply various models of high quality at competitive prices. If you are interested, please feel free to contact me any time or browse our website (www.centalic.com) for other models with detailed specifications. Thanks a lot!
Pitch 0.45mm
Mechanical Specification
Full Stroke: 1.3mm
Rated Stroke: 0.80mm
Spring Force: 20gf@load 0.80mm
Electrical Specification Current Rating: 0.3A, Continuous
Bandwidth: 2GHz@-1dB
Propagation Delay: 42 ps
Materials
Barrel: Phosphor Bronze, Gold Plated.
Plunger: Full-Hard beryllium Copper. Gold Plated
Spring: Music Wire, Gold Plated.
Semi-conductor test probe SCP035(63)-BU-86-G is can be applied to mobile phones, computers, etc. In addition to this model, we also manufacture a variety of test probes of small diameters. With over 30 years’ manufacturing experience, our factory is able to supply various models of high quality at competitive prices. If you are interested, please feel free to contact me any time or browse our website (www.centalic.com) for other models with detailed specifications. Thanks a lot!
Certificate
- ISO:9001:2008
Main Products
Test System, Test Probes, Test Fixture and Fixture accessories