Semi-conductor test probe SCP051(37)-UU-57-G
Pitch 0.65mm
Mechanical Specification
Full Stroke: 1.30mm
Rated Stroke: 0.96mm
Spring Force: 32gf@ Load 0.80mm
Electrical Specification
Current Rating : 1A,Continuous
Bandwidth:5.5GHz@-1dB
Propagation Delay:26ps
Materials
Barrel: PhosphorBronze, Gold Plated.
Plunger: Full-HardBeryllium Copper. Gold Plated.
Spring: Music Wire,Gold Plated
Semi-conductor test probe SCP051(37)-UU-57-G can be applied to advanced electronic products. Besides, our factory provides other models of high quality at competitive prices. With over 30 years’ manufacturing experience, we assure globe customers of our quality and dispatching products without delay.
Pitch 0.65mm
Mechanical Specification
Full Stroke: 1.30mm
Rated Stroke: 0.96mm
Spring Force: 32gf@ Load 0.80mm
Electrical Specification
Current Rating : 1A,Continuous
Bandwidth:5.5GHz@-1dB
Propagation Delay:26ps
Materials
Barrel: PhosphorBronze, Gold Plated.
Plunger: Full-HardBeryllium Copper. Gold Plated.
Spring: Music Wire,Gold Plated
Semi-conductor test probe SCP051(37)-UU-57-G can be applied to advanced electronic products. Besides, our factory provides other models of high quality at competitive prices. With over 30 years’ manufacturing experience, we assure globe customers of our quality and dispatching products without delay.
Certificate
- ISO 9001:2008
Main Products
Test System, Test Probes, Test Fixture and Fixture accessories