Semiconductor test probes are mainly used for the fields of semiconductor tests and frequency tests of communication devices
SCPA020 Newest Semiconductor Test Pin with Double End
Product Description
Semiconductor test probes are usually called double-ended spring probes or RF test probes. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly used for the fields of semiconductor tests and frequency tests of communication devices, for example the frequency tests of mobile phones, walkie-talkies, computers, radios, etc.
This product is the tiniest series in semiconductor test probes since its outside diameter is only 0.2mm. It can be applied to the tests of products calling for relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in domestic technology. Our complete production lines can also meet the needs for mass production.
Product Description
Semiconductor test probes are usually called double-ended spring probes or RF test probes. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly used for the fields of semiconductor tests and frequency tests of communication devices, for example the frequency tests of mobile phones, walkie-talkies, computers, radios, etc.
This product is the tiniest series in semiconductor test probes since its outside diameter is only 0.2mm. It can be applied to the tests of products calling for relatively high accuracy, for example frequency tests of semiconductor and communication devices. Developed and manufactured on our own, this product takes the lead in domestic technology. Our complete production lines can also meet the needs for mass production.
Certificate
- ISO 9001:2008
Main Products
test probes