Semiconductor test probes are mainly used for the fields of semiconductor tests and frequency tests of communication devices
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Description
Semiconductor test probes are usually called double-ended spring probes or RF test probes. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly used for the fields of semiconductor tests and frequency tests of communication devices, for example the frequency tests of mobile phones, walkie-talkies, computers, radios, etc.
Shenzhen Centalic Metal Part Limited, the biggest domestic manufacturing base of test probes, owns the most comprehensive automation production lines. It has concentrated on test industry for over 30 years and developed the most comprehensive product series. Centalic develops various test probes in order to provide accurate tests for your products.
Description
Semiconductor test probes are usually called double-ended spring probes or RF test probes. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly used for the fields of semiconductor tests and frequency tests of communication devices, for example the frequency tests of mobile phones, walkie-talkies, computers, radios, etc.
Shenzhen Centalic Metal Part Limited, the biggest domestic manufacturing base of test probes, owns the most comprehensive automation production lines. It has concentrated on test industry for over 30 years and developed the most comprehensive product series. Centalic develops various test probes in order to provide accurate tests for your products.
Certificate
- ISO 9001: 2008
Main Products
test probes